88 search results - page 10 / 18 » A Planar Light Probe |
ACCV
2007
Springer
14 years 1 months ago
2007
Springer
In this paper, we first describe our approach to measuring the surface shape of specular objects and then we extend the method to measuring the surface shape of transparent object...
ICCV
1995
IEEE
13 years 11 months ago
1995
IEEE
The standard methods for extracting range data from optical triangulation scanners are accurate only for planar objects of uniform reflectance illuminated by an incoherentsource....
MR
2007
13 years 7 months ago
2007
This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
This paper describes a novel hand-based verification system based on palm-finger segmentation and fusion. The proposed system operates on 2D hand images acquired by placing the ha...
ECCV
2008
Springer
14 years 9 months ago
2008
Springer
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although...