515 search results - page 11 / 103 » A Reduced Complexity Algorithm for Minimizing N-Detect Tests |
DATE
2000
IEEE
14 years 25 days ago
2000
IEEE
This paper presents a new compaction algorithm to improve the yield of IC layout. The yield is improved by reducing the area where the faults are more likely to happen known as cr...
ICCD
2004
IEEE
14 years 5 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
UAI
2004
13 years 9 months ago
2004
The complexity of a reasoning task over a graphical model is tied to the induced width of the underlying graph. It is well-known that the conditioning (assigning values) on a subs...
JAIR
2010
13 years 6 months ago
2010
We provide a series of algorithms demonstrating that solutions according to the fundamental game-theoretic solution concept of closed under rational behavior (CURB) sets in two-pl...
SENSYS
2003
ACM
14 years 1 months ago
2003
ACM
Sensor networks not only have the potential to change the way we use, interact with, and view computers, but also the way we use, interact with, and view the world around us. In o...