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CVPR
2006
IEEE
14 years 9 months ago
2006
IEEE
In this paper, we present a novel approach to learning semantic localized patterns with binary projections in a supervised manner. The pursuit of these binary projections is refor...
ICCV
2003
IEEE
14 years 9 months ago
2003
IEEE
This paper addresses the problem of applying powerful pattern recognition algorithms based on kernels to efficient visual tracking. Recently Avidan [1] has shown that object recog...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Computational complexity has been the primary challenge of many VLSI CAD applications. The emerging multicore and manycore microprocessors have the potential to offer scalable perf...
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
VLDB
2007
ACM
14 years 7 months ago
2007
ACM
Views over probabilistic data contain correlations between tuples, and the current approach is to capture these correlations using explicit lineage. In this paper we propose an al...