420 search results - page 5 / 84 » A Small Test Generator for Large Designs |
ITC
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
JAL
1998
13 years 7 months ago
1998
We describe a very general technique for generating families of combinatorial objects without isomorphs. It applies to almost any class of objects for which an inductive construct...
DSD
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
CODES
2000
IEEE
13 years 12 months ago
2000
IEEE
In current design practice synthesis tools play a key role, letting designers to concentrate on the specificationof the system being designed by carrying out repetitive tasks such...