Sciweavers

89 search results - page 6 / 18
» A Statistical Model for Electromigration Failures
Sort
View
DAC
2009
ACM
14 years 8 months ago
SRAM parametric failure analysis
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...
ICDCS
2006
IEEE
14 years 1 months ago
Scalable and Robust Aggregation Techniques for Extracting Statistical Information in Sensor Networks
Wireless sensor networks have stringent constraints on system resources and data aggregation techniques are critically important. However, accurate data aggregation is difficult ...
Hongbo Jiang, Shudong Jin
ACL
2008
13 years 9 months ago
A Discriminative Latent Variable Model for Statistical Machine Translation
Large-scale discriminative machine translation promises to further the state-of-the-art, but has failed to deliver convincing gains over current heuristic frequency count systems....
Phil Blunsom, Trevor Cohn, Miles Osborne
COMPSAC
2011
IEEE
12 years 7 months ago
Precise Propagation of Fault-Failure Correlations in Program Flow Graphs
Abstract—Statistical fault localization techniques find suspicious faulty program entities in programs by comparing passed and failed executions. Existing studies show that such ...
Zhenyu Zhang, W. K. Chan, T. H. Tse, Bo Jiang
SOCC
2008
IEEE
151views Education» more  SOCC 2008»
14 years 1 months ago
Failure analysis for ultra low power nano-CMOS SRAM under process variations
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
Jawar Singh, Jimson Mathew, Dhiraj K. Pradhan, Sar...