The probability that a failure will occur before the end of the computation increases as the number of processors used in a high performance computing application increases. For l...
In this paper the problem of fault-tolerant message routing in two-dimensional meshes, with each inner node having 4 neighbors, is investigated. It is assumed that some nodes/links...
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
—Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in develo...
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...