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» A Systematic Approach for Designing Testable VLSI Circuits
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IPPS
2002
IEEE
14 years 19 days ago
Fast Inductance Extraction of Large VLSI Circuits
Accurate estimation of signal delay is critical to the design and verification of VLSI circuits. At very high frequencies, signal delay in circuits with small feature sizes is do...
Hemant Mahawar, Vivek Sarin, Weiping Shi
GLVLSI
2006
IEEE
105views VLSI» more  GLVLSI 2006»
14 years 1 months ago
A practical approach for monitoring analog circuits
Formal methods have been advocated for the verification of digital design where correctness is proved mathematically. In contrast to digital designs, the verification of analog ...
Mohamed H. Zaki, Sofiène Tahar, Guy Bois
DT
2007
57views more  DT 2007»
13 years 7 months ago
Leakage Minimization Technique for Nanoscale CMOS VLSI
This paper proposes a new heuristic approach to determine the input pattern that minimizes leakage currents of nanometer CMOS circuits during sleep mode considering stack and fano...
Kyung Ki Kim, Yong-Bin Kim, Minsu Choi, Nohpill Pa...
GLVLSI
1998
IEEE
124views VLSI» more  GLVLSI 1998»
13 years 12 months ago
A VLSI High-Performance Encoder with Priority Lookahead
In this paper we introduce a VLSI priority encoder that uses a novel priority lookahead scheme to reduce the delay for the worse case operation of the circuit, while maintaining a...
José G. Delgado-Frias, Jabulani Nyathi
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
14 years 20 days ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi