729 search results - page 11 / 146 » A Transitive Closure Based Algorithm for Test Generation |
VLSID
1997
IEEE
13 years 11 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ENTCS
2007
13 years 7 months ago
2007
Abstract. Model-based testing has been proposed as a technique to automatically verify that a system conforms to its specification. A popular approach is to use a model-checker to...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
VLSID
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
EMSOFT
2008
Springer
13 years 9 months ago
2008
Springer
We investigate the problem of specification based testing with dense sets of inputs and outputs, in particular with imprecision as they might occur due to errors in measurements, ...