This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
We propose static program analysis techniques for identifying the impact of relational database schema changes upon object-oriented applications. We use dataflow analysis to extra...
ity Abstraction for Declarative Networking Applications Juan A. Navarro P?erez, Andrey Rybalchenko, and Atul Singh Max Planck Institute for Software Systems (MPI-SWS) Declarative N...
Andrey Rybalchenko, Atul Singh, Juan Antonio Navar...
Discriminative sequential learning models like Conditional Random Fields (CRFs) have achieved significant success in several areas such as natural language processing, information...
Xuan Hieu Phan, Minh Le Nguyen, Tu Bao Ho, Susumu ...