4 search results - page 1 / 1 » A deterministic dynamic element matching approach to ADC tes... |
ISCAS
2003
IEEE
14 years 22 days ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
AAAI
2006
13 years 8 months ago
2006
LOCATE is workspace layout design software that also serves as a testbed for developing and refining principles of adaptive aiding. This demonstration illustrates LOCATE's ab...