35 search results - page 4 / 7 » A fast and accurate light reflection model |
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
Accurately identifying corresponded landmarks from a population of shape instances is the major challenge in constructing statistical shape models. In this paper, we address this ...
KDD
2010
ACM
13 years 11 months ago
2010
ACM
Feature selection is an important task in order to achieve better generalizability in high dimensional learning, and structure learning of Markov random fields (MRFs) can automat...
CGF
2010
13 years 6 months ago
2010
We present a technique for rapid capture of high quality bidirectional reflection distribution functions(BRDFs) of surface points. Our method represents the BRDF at each point by ...
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
This paper explores the recovery and rate capacity effect for batteries used in embedded systems. It describes the prominent battery models with their advantages and drawbacks. It...