The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...
We introduce tractable classes of VCSP instances based on convex cost functions. Firstly, we show that the class of VCSP instances satisfying the hierarchically nested convexity pr...
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...
Abstract. There are conflicting reports over whether multiple independent runs of genetic algorithms (GAs) with small populations can reach solutions of higher quality or can fin...
We address the problem of efficient out-of-core code generation for a special class of imperfectly nested loops encoding tensor contractions arising in quantum chemistry computati...