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HICSS
2009
IEEE
117views Biometrics» more  HICSS 2009»
14 years 2 months ago
Issues Related to Development of E/E Product Line Architectures in Heavy Vehicles
The amount of electronics in vehicles is growing quickly, thus systems are becoming increasingly complex which makes the engineering of these software intensive systems more and m...
Peter Wallin, Stefan Johnsson, Jakob Axelsson
MSR
2005
ACM
14 years 1 months ago
Repository mining and Six Sigma for process improvement
In this paper, we propose to apply artifact mining in a global development environment to support measurement based process management and improvement, such as SEI/CMMI’s GQ(I)M...
Michael VanHilst, Pankaj K. Garg, Christopher Lo
IOLTS
2003
IEEE
124views Hardware» more  IOLTS 2003»
14 years 24 days ago
The positive effect on IC yield of embedded Fault Tolerance for SEUs
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst
WSC
1997
13 years 8 months ago
AutoSched Tutorial
The AutoSchedTM finite capacity planning and scheduling tool helps you increase throughput, reduce in-process inventory, and increase equipment and personnel utilization. AutoSche...
Bill Lindler
WSC
1994
13 years 8 months ago
AutoStat
Whether designing a new system or modifying an existing one, engineers want to take the guesswork out of finding the best possible solution. While there are many analysis methods ...
Matthew W. Rohrer