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DAC
1997
ACM
14 years 1 months ago
STARBIST: Scan Autocorrelated Random Pattern Generation
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...
ISSRE
2003
IEEE
14 years 2 months ago
Exploiting Symmetries to Test Programs
Symmetries often appear as properties of many artifical settings. In Program Testing, they can be viewed as properties of programs and can be given by the tester to check the cor...
Arnaud Gotlieb
ISSRE
2003
IEEE
14 years 2 months ago
An Empirical Study on Testing and Fault Tolerance for Software Reliability Engineering
Software testing and software fault tolerance are two major techniques for developing reliable software systems, yet limited empirical data are available in the literature to eval...
Michael R. Lyu, Zubin Huang, Sam K. S. Sze, Xia Ca...
IPPS
2003
IEEE
14 years 2 months ago
Distributed P2P Computing within Triana: A Galaxy Visualization Test Case
We discuss here a parallel implementation of the visualisation of data from a galaxy formation simulation within the Triana problem-solving environment. The visualisation is a tes...
Ian J. Taylor, Matthew S. Shields, Ian Wang, Roger...
SP
2006
IEEE
214views Security Privacy» more  SP 2006»
14 years 3 months ago
Automatically Generating Malicious Disks using Symbolic Execution
Many current systems allow data produced by potentially malicious sources to be mounted as a file system. File system code must check this data for dangerous values or invariant ...
Junfeng Yang, Can Sar, Paul Twohey, Cristian Cadar...