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SBCCI
2009
ACM
131views VLSI» more  SBCCI 2009»
14 years 9 days ago
Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown
Because of the aggressive scaling of integrated circuits and the given limits of atomic scales, circuit designers have to become more and more aware of the arising reliability and...
Hagen Sämrow, Claas Cornelius, Frank Sill, An...
TAMC
2009
Springer
14 years 5 days ago
On the Complexity of the Multiple Stack TSP, kSTSP
Given a universal constant k, the multiple Stack Travelling Salesman Problem (kSTSP in short) consists in finding a pickup tour T1 and a delivery tour T2 of n items on two distinc...
Sophie Toulouse, Roberto Wolfler Calvo
AIWORC
2000
IEEE
14 years 2 days ago
Distance Learning Using Web-Based Multimedia Environment
The "schooling industry" is faced with an inescapable demand to redefine its endeavors in terms of producing learning, rather than providing instructions. We propose a h...
Khalid J. Siddiqui, Junaid Ahmed Zubairi
FOCS
2000
IEEE
14 years 2 days ago
Opportunistic Data Structures with Applications
There is an upsurging interest in designing succinct data structures for basic searching problems (see [23] and references therein). The motivation has to be found in the exponent...
Paolo Ferragina, Giovanni Manzini
CAISE
2000
Springer
14 years 3 hour ago
An Overview of RoZ: A Tool for Integrating UML and Z Specifications
This paper presents an approach and a tool to increase specification quality by using a combination of UML and formal languages. Our approach is based on the expression of the UML ...
Sophie Dupuy, Yves Ledru, Monique Chabre-Peccoud