In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Web applications are the most common way to make services and data available on the Internet. Unfortunately, with the increase in the number and complexity of these applications, ...
Viktoria Felmetsger, Ludovico Cavedon, Christopher...
Verifying that access-control systems maintain desired security properties is recognized as an important problem in security. Enterprise access-control systems have grown to prote...
Karthick Jayaraman, Vijay Ganesh, Mahesh V. Tripun...