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KBSE
2005
IEEE
14 years 28 days ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
USS
2010
13 years 5 months ago
Toward Automated Detection of Logic Vulnerabilities in Web Applications
Web applications are the most common way to make services and data available on the Internet. Unfortunately, with the increase in the number and complexity of these applications, ...
Viktoria Felmetsger, Ludovico Cavedon, Christopher...
CCS
2011
ACM
12 years 7 months ago
Automatic error finding in access-control policies
Verifying that access-control systems maintain desired security properties is recognized as an important problem in security. Enterprise access-control systems have grown to prote...
Karthick Jayaraman, Vijay Ganesh, Mahesh V. Tripun...