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    ISCAS
    2005
    IEEE
    100views Hardware» more  ISCAS 2005»
    A test strategy for time-to-digital converters using dynamic element matching and dithering
    14 years 12 days ago
    A test strategy for time-to-digital converters using dynamic element matching and dithering
    Download  class.ece.iastate.edu
    This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
    Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger...
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    ISCAS
    2005
    IEEE
    153views Hardware» more  ISCAS 2005»
    A two-step DDEM ADC for accurate and cost-effective DAC testing
    14 years 12 days ago
    A two-step DDEM ADC for accurate and cost-effective DAC testing
    Download  class.ece.iastate.edu
    — This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
    Hanqing Xing, Degang Chen, Randall L. Geiger
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