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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
14 years 2 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
ICIP
2001
IEEE
14 years 11 months ago
Rate-distortion unequal error protection for fractal image codes
Fractal image codes are very sensitive to bit errors because the decoding of a block is dependent not only on the code information associated to this block but also on the code in...
Vladimir Stankovic, Dietmar Saupe, Raouf Hamzaoui
FSE
1998
Springer
131views Cryptology» more  FSE 1998»
14 years 2 months ago
Cryptanalysis of TWOPRIME
Ding et al [DNRS97] propose a stream generator based on several layers. We present several attacks. First, we observe that the non-surjectivity of a linear combination step allows ...
Don Coppersmith, David Wagner, Bruce Schneier, Joh...
EURONGI
2006
Springer
14 years 1 months ago
Joint Connection and Packet Level Analysis in W-CDMA Radio Interface
Abstract. This work introduces a new analytical method for performance evaluation of wireless packet-oriented networks. Unlike traditional call admission control procedures commonl...
Vilius Benetis, Larissa Popova, Villy Bæk Iv...
TARK
2007
Springer
14 years 4 months ago
Alternating-time temporal logic with explicit strategies
We introduce ATLES – a variant of ATL with explicit names for strategies in the object language. ATLES makes it possible to refer to the same strategy in different occurrences o...
Dirk Walther, Wiebe van der Hoek, Michael Wooldrid...