167 search results - page 8 / 34 » Accounting for defect characteristics in evaluations of test... |
ACCV
1998
Springer
13 years 11 months ago
1998
Springer
The project we are working on is to help develop and test a low cost, large area, high resolution X-ray detection system with a high dynamic range. The large area is achieved by b...
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
AGENTS
2001
Springer
13 years 12 months ago
2001
Springer
To develop agent-based systems, one needs a methodology that supports the development process as common in other disciplines. In recent years, several such methodologies and model...
ICCCN
2007
IEEE
14 years 1 months ago
2007
IEEE
— Low rate DoS attacks are emerging threats to the TCP traffic, and the VoIP traffic in the Internet. They are hard to detect as they intelligently send attack traffic inside the...
PADL
2010
Springer
14 years 4 months ago
2010
Springer
Abstract. We address the problem of detecting some commonly occurring kinds of race conditions in Erlang programs using static analysis. Our analysis is completely automatic, fast ...