With the proliferation of different types of IC packages, there is a need for machine-vision-based inspection systems to be able to efficiently identify the orientation of IC packa...
We introduce a constructive, incremental learning system for regression problems that models data by means of spatially localized linear models. In contrast to other approaches, t...
Single-thread performance, reliability and power efficiency are critical design challenges of future multicore systems. Although point solutions have been proposed to address thes...
Shantanu Gupta, Shuguang Feng, Amin Ansari, Scott ...
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
Jacob D. Biamonte, Jeff S. Allen, Marek A. Perkows...
Abstract— We present on-line tunable diagnostic and membership protocols for generic time-triggered (TT) systems to detect crashes, send/receive omission faults and network parti...