The lifetime of solid-state image sensors is limited by the appearance of defects, particularly hot-pixels, which we have previously shown to develop continuously over the sensor ...
Jenny Leung, Glenn H. Chapman, Zahava Koren, Israe...
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
— Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is pro...
Abstract. Wireless sensor networks are often densely deployed for environmental monitoring applications. Collecting raw data from these networks can lead to excessive energy consum...
Supriyo Chatterjea, Tim Nieberg, Yang Zhang, Paul ...
We propose a framework for detecting and tracking multiple interacting objects, while explicitly handling the dual problems of fragmentation (an object may be broken into several ...