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» Alternative Test Methods Using IEEE 1149.4
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VTS
1999
IEEE
66views Hardware» more  VTS 1999»
13 years 12 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
INFOCOM
2010
IEEE
13 years 6 months ago
Metrics for Evaluating Video Streaming Quality in Lossy IEEE 802.11 Wireless Networks
—Peak Signal-to-Noise Ratio (PSNR) is the simplest and the most widely used video quality evaluation methodology. However, traditional PSNR calculations do not take the packet lo...
An Chan, Kai Zeng, Prasant Mohapatra, Sung-Ju Lee,...
DSD
2005
IEEE
105views Hardware» more  DSD 2005»
14 years 1 months ago
Improved Fault Emulation for Synchronous Sequential Circuits
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
Jaan Raik, Peeter Ellervee, Valentin Tihhomirov, R...
AICCSA
2001
IEEE
172views Hardware» more  AICCSA 2001»
13 years 11 months ago
Methods and Metrics for Selective Regression Testing
In corrective maintenance, selective regression testing includes test selection from previously run test suite and test coverage identification. We propose three reductionbased re...
Rami Bahsoon, Nashat Mansour
ISSRE
2006
IEEE
14 years 1 months ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...