2451 search results - page 76 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ISQED
2003
IEEE
14 years 1 months ago
2003
IEEE
An intermediate solution between conventional printed circuit board technology and wafer level packaging, WLP, is to fabricate interconnection circuits and flip chip assembly stru...
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
ICDIM
2007
IEEE
14 years 2 months ago
2007
IEEE
: Some measures such as average precision over all relevant documents and recall level precision are considered as good system-oriented measures, because they concern both precisio...
ICML
2010
IEEE
13 years 8 months ago
2010
IEEE
We propose to combine two approaches for modeling data admitting sparse representations: on the one hand, dictionary learning has proven effective for various signal processing ta...
ISSRE
2007
IEEE
13 years 9 months ago
2007
IEEE
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...