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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 12 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
CORR
2006
Springer
153views Education» more  CORR 2006»
13 years 8 months ago
Genetic Programming, Validation Sets, and Parsimony Pressure
Fitness functions based on test cases are very common in Genetic Programming (GP). This process can be assimilated to a learning task, with the inference of models from a limited n...
Christian Gagné, Marc Schoenauer, Marc Pari...
ICCV
2009
IEEE
15 years 1 months ago
Domain Adaptive Semantic Diffusion for Large Scale Context-Based Video Annotation
Learning to cope with domain change has been known as a challenging problem in many real-world applications. This paper proposes a novel and efficient approach, named domain ada...
Yu-Gang Jiang, Jun Wang, Shih-Fu Chang, Chong-Wah ...
ECCV
2004
Springer
14 years 10 months ago
Shape Reconstruction from 3D and 2D Data Using PDE-Based Deformable Surfaces
In this paper, we propose a new PDE-based methodology for deformable surfaces that is capable of automatically evolving its shape to capture the geometric boundary of the data and ...
Ye Duan, Liu Yang, Hong Qin, Dimitris Samaras
AINA
2008
IEEE
14 years 3 months ago
Missing Value Estimation for Time Series Microarray Data Using Linear Dynamical Systems Modeling
The analysis of gene expression time series obtained from microarray experiments can be effectively exploited to understand a wide range of biological phenomena from the homeostat...
Connie Phong, Raul Singh