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WSC
2008
13 years 11 months ago
An analytical model for conveyor based AMHS in semiconductor wafer fabs
This paper proposes an analytical model useful in the design of conveyor-based Automated Material Handling Systems (AMHS) to support semiconductor manufacturing. The objective is ...
Dima Nazzal, Andrew Johnson, Hector J. Carlo, Jesu...
PTS
2007
102views Hardware» more  PTS 2007»
13 years 10 months ago
Testing and Model-Checking Techniques for Diagnosis
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
Maxim Gromov, Tim A. C. Willemse
MICCAI
2004
Springer
14 years 10 months ago
3D Bayesian Regularization of Diffusion Tensor MRI Using Multivariate Gaussian Markov Random Fields
3D Bayesian regularization applied to diffusion tensor MRI is presented here. The approach uses Markov Random Field ideas and is based upon the definition of a 3D neighborhood syst...
Marcos Martín-Fernández, Carl-Fredri...
ETFA
2005
IEEE
14 years 2 months ago
Quantitative evaluation of the safety of X-by-Wire architecture subject to EMI perturbations
The X-by-Wire systems in cars can only be accepted if they provide at least the same dependability than the traditional ones. In this paper we propose a new approach to evaluate t...
C. Wilwert, Françoise Simonot-Lion, Yeqiong...
ADVIS
2004
Springer
14 years 2 months ago
On the Application of WF-Nets for Checking Hybrid IDEF0-IDEF3 Business Process Models
Abstract. In many practical business process modelling scenarios using Petri nets, the resultant model does not have a single input place and a single output place. In particular, ...
Costin Badica, Chris Fox