Commercial SRAM-based FPGAs have the potential to provide aerospace applications with the necessary performance to meet next-generation mission requirements. However, the suscepti...
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
Domain-partition (DP) model is a general model for reliability maximization problem under given redundancy. In this paper, an improved DP model is used to formulate a reconfigurati...
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
Alex Shye, Tipp Moseley, Vijay Janapa Reddi, Josep...
—We introduce Zen, a new resource allocation framework that assigns application components to node clusters to achieve high availability for partial-fault tolerant (PFT) applicat...