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VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
14 years 7 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
ICSEA
2007
IEEE
14 years 1 months ago
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
Gordon Fraser, Franz Wotawa
ECOOP
2006
Springer
13 years 11 months ago
Augmenting Automatically Generated Unit-Test Suites with Regression Oracle Checking
A test case consists of two parts: a test input to exercise the program under test and a test oracle to check the correctness of the test execution. A test oracle is often in the f...
Tao Xie
ICST
2010
IEEE
13 years 5 months ago
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
Sergio Segura, Robert M. Hierons, David Benavides,...
TASE
2009
IEEE
14 years 2 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...