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SMI
1999
IEEE
14 years 1 months ago
1999
IEEE
Inspection of reflection line patterns is a standard way to check the quality of free form surfaces. In this paper, we describe an approach which enables the designer to control d...
CVPR
2006
IEEE
14 years 10 months ago
2006
IEEE
In this paper, we present a novel approach to learning semantic localized patterns with binary projections in a supervised manner. The pursuit of these binary projections is refor...
KDD
2009
ACM
14 years 9 months ago
2009
ACM
Mining discrete patterns in binary data is important for subsampling, compression, and clustering. We consider rankone binary matrix approximations that identify the dominant patt...
CVPR
2010
IEEE
13 years 10 months ago
2010
IEEE
Background modeling plays an important role in video surveillance, yet in complex scenes it is still a challenging problem. Among many difficulties, problems caused by illuminatio...
ICTAI
1993
IEEE
14 years 26 days ago
1993
IEEE
Selecting a set of features which is optimal for a given task is a problem which plays an important role in a wide variety of contexts including pattern recognition, adaptive cont...