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GLVLSI
2008
IEEE
120views VLSI» more  GLVLSI 2008»
16 years 20 days ago
SAT-based equivalence checking of threshold logic designs for nanotechnologies
Novel nano-scale devices have shown promising potential to overcome physical barriers faced by complementary metaloxide semiconductor (CMOS) technology in future circuit design. H...
Yexin Zheng, Michael S. Hsiao, Chao Huang
ICARCV
2008
IEEE
222views Robotics» more  ICARCV 2008»
16 years 20 days ago
Robust fusion using boosting and transduction for component-based face recognition
—Face recognition performance depends upon the input variability as encountered during biometric data capture including occlusion and disguise. The challenge met in this paper is...
Fayin Li, Harry Wechsler, Massimo Tistarelli
WCRE
2008
IEEE
16 years 18 days ago
Reverse Engineering CAPTCHAs
CAPTCHAs are automated Turing tests used to determine if the end-user is human and not an automated program. Users are asked to read and answer Visual CAPTCHAs, which often appear...
Abram Hindle, Michael W. Godfrey, Richard C. Holt
174
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ACNS
2008
Springer
103views Cryptology» more  ACNS 2008»
16 years 17 days ago
A Very Compact "Perfectly Masked" S-Box for AES
Implementations of the Advanced Encryption Standard (AES), including hardware applications with limited resources (e.g., smart cards), may be vulnerable to “side-channel attacksâ...
D. Canright, Lejla Batina
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
16 years 17 days ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...