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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
14 years 9 days ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
GECCO
2005
Springer
113views Optimization» more  GECCO 2005»
14 years 2 months ago
Search-based mutation testing for Simulink models
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
Yuan Zhan, John A. Clark
RISE
2005
Springer
14 years 2 months ago
Software Testing with Evolutionary Strategies
Abstract. This paper applies the Evolutionary Strategy (ES) metaheuristic to the automatic test data generation problem. The problem consists in creating automatically a set of inp...
Enrique Alba, J. Francisco Chicano
TOG
2010
126views more  TOG 2010»
13 years 3 months ago
Automatic generation of destination maps
Destination maps are navigational aids designed to show anyone within a region how to reach a location (the destination). Handdesigned destination maps include only the most impor...
Johannes Kopf, Maneesh Agrawala, David Bargeron, D...
CCS
2010
ACM
13 years 6 months ago
The limits of automatic OS fingerprint generation
Remote operating system fingerprinting relies on implementation differences between OSs to identify the specific variant executing on a remote host. Because these differences can ...
David W. Richardson, Steven D. Gribble, Tadayoshi ...