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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
15 years 7 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
GECCO
2005
Springer
113views Optimization» more  GECCO 2005»
15 years 9 months ago
Search-based mutation testing for Simulink models
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
Yuan Zhan, John A. Clark
RISE
2005
Springer
15 years 9 months ago
Software Testing with Evolutionary Strategies
Abstract. This paper applies the Evolutionary Strategy (ES) metaheuristic to the automatic test data generation problem. The problem consists in creating automatically a set of inp...
Enrique Alba, J. Francisco Chicano
TOG
2010
126views more  TOG 2010»
14 years 10 months ago
Automatic generation of destination maps
Destination maps are navigational aids designed to show anyone within a region how to reach a location (the destination). Handdesigned destination maps include only the most impor...
Johannes Kopf, Maneesh Agrawala, David Bargeron, D...
155
Voted
CCS
2010
ACM
15 years 1 months ago
The limits of automatic OS fingerprint generation
Remote operating system fingerprinting relies on implementation differences between OSs to identify the specific variant executing on a remote host. Because these differences can ...
David W. Richardson, Steven D. Gribble, Tadayoshi ...