We propose an effective approach to diagnose multiple design errors in HDL designs with only one erroneous test case. Error candidates will be greatly reduced while ensuring that ...
Tai-Ying Jiang, Chien-Nan Jimmy Liu, Jing-Yang Jou
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
This paper describes a diagnosis technique for locating design errors in circuit implementations which do not match their functional specification. The method efficiently propagat...
Andreas Kuehlmann, David Ihsin Cheng, Arvind Srini...