Sciweavers

3120 search results - page 596 / 624
» An optimal architecture for a DDC
Sort
View
DAC
2009
ACM
14 years 10 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
14 years 10 months ago
Handling complexities in modern large-scale mixed-size placement
In this paper, we propose an effective algorithm flow to handle largescale mixed-size placement. The basic idea is to use floorplanning to guide the placement of objects at the gl...
Jackey Z. Yan, Natarajan Viswanathan, Chris Chu
DAC
2009
ACM
14 years 10 months ago
ILP-based pin-count aware design methodology for microfluidic biochips
Digital microfluidic biochips have emerged as a popular alternative for laboratory experiments. To make the biochip feasible for practical applications, pin-count reduction is a k...
Cliff Chiung-Yu Lin, Yao-Wen Chang
DAC
2009
ACM
14 years 10 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
DAC
2009
ACM
14 years 10 months ago
Double patterning lithography friendly detailed routing with redundant via consideration
In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...
Kun Yuan, Katrina Lu, David Z. Pan