118 search results - page 8 / 24 » Analysis and Minimization of Test Time in a Combined BIST an... |
ICSE
2010
IEEE-ACM
13 years 11 months ago
2010
IEEE-ACM
Change impact analysis aims at identifying software artifacts being affected by a change. In the past, this problem has been addressed by approaches relying on static, dynamic, a...
IPL
2007
13 years 6 months ago
2007
A new algorithm is presented for testing if a regular language is locally threshold testable. The new algorithm is slower than existing algorithms, but its correctness proof is sh...
ER
2007
Springer
14 years 27 days ago
2007
Springer
Organizations are under increasing scrutiny to document their compliance to regulatory requirements. To this end, they have to formally document their operating procedures to supp...
CONSTRAINTS
2007
13 years 6 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
CLEF
2008
Springer
13 years 8 months ago
2008
Springer
Abstract. LogAnswer is a logic-oriented question answering system developed by the AI research group at the University of Koblenz-Landau and by the IICS at the University of Hagen....