: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
Secondary school students, when investigating tertiary study, have little opportunity to discover what a particular course has to offer and often have a poor understanding of empl...
Many applications commonly found in digital signal processing and image processing applications can be represented by data-flow graphs (DFGs). In our previous work, we proposed a ...
Abstract. Recent theories of universal algorithmic intelligence, combined with the view that the world can be completely specified in mathematical terms, have led to claims about ...
In this paper we present a method for learning classspecific
features for recognition. Recently a greedy layerwise
procedure was proposed to initialize weights of deep
belief ne...
Mohammad Norouzi (Simon Fraser University), Mani R...