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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 15 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
IMC
2007
ACM
13 years 10 months ago
Understanding the limitations of transmit power control for indoor wlans
A wide range of transmit power control (TPC) algorithms have been proposed in recent literature to reduce interference and increase capacity in 802.11 wireless networks. However, ...
Vivek Shrivastava, Dheeraj Agrawal, Arunesh Mishra...
SDM
2007
SIAM
131views Data Mining» more  SDM 2007»
13 years 10 months ago
Load Shedding in Classifying Multi-Source Streaming Data: A Bayes Risk Approach
In many applications, we monitor data obtained from multiple streaming sources for collective decision making. The task presents several challenges. First, data in sensor networks...
Yijian Bai, Haixun Wang, Carlo Zaniolo
CIVR
2010
Springer
246views Image Analysis» more  CIVR 2010»
13 years 7 months ago
Genre-specific semantic video indexing
In many applications, we find large video collections from different genres where the user is often only interested in one or two specific video genres. So, when users are queryin...
Jun Wu, Marcel Worring
COMPGEOM
2004
ACM
14 years 20 days ago
Continuous path verification in multi-axis NC-machining
We introduce a new approach to the problem of collision detection between a rotating milling-cutter of an NC-machine and a model of a solid workpiece, as the rotating cutter conti...
Ron Wein, Oleg Ilushin, Gershon Elber, Dan Halperi...