1398 search results - page 147 / 280 » Application-Specific Integrated Circuits |
DAC
2006
ACM
14 years 9 months ago
2006
ACM
This paper presents analysis methods for energy estimation in RC trees driven by time-varying voltage sources, e.g., buffers, timevarying power supplies, and resonant clock genera...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
ISMVL
2008
IEEE
14 years 2 months ago
2008
IEEE
Nanoscale multiple-valued logic systems require the development of nanometer scale integrated circuits and components. Due to limits in device physics, new components must be deve...