1398 search results - page 22 / 280 » Application-Specific Integrated Circuits |
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
ITC
1996
IEEE
14 years 2 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
DATE
2007
IEEE
14 years 4 months ago
2007
IEEE
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...
ISQED
2005
IEEE
14 years 3 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...