Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probab...
Arun A. Nair, Stijn Eyerman, Lieven Eeckhout, Lizy...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
In this paper we study the computation error tolerance properties of motion estimation algorithms. We are motivated by two scenarios where hardware systems may introduce computati...
Critical systems like pace-makers, defibrillators, wearable computers and other electronic gadgets have to be designed not only for reliability but also for ultra-low power consu...
A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure fol...