This paper presents an inspection method of particle contamination for semiconductor reticles using continuous wavelet transform. Particle defect is considered as a singularity in...
Although, most of phenomena change over time, there has been an attempt to model the phenomena of real world assuming a static nature for them. Even when changes occurred in the p...
Missing data is a widespread problem that can affect the ability to use data to construct effective prediction systems. We investigate a common machine learning technique that can...
Qinbao Song, Martin J. Shepperd, Xiangru Chen, Jun...
In this paper, we present a general computational and operational framework for the Fuzzy Cognitive Network (FCN), which is a direct extension of Fuzzy Cognitive Maps (FCM). The pr...
Theodoros L. Kottas, Yiannis S. Boutalis, Manolis ...
In this paper, we investigate the use of the watershed transformation for integrating spatial and spectral information in the process of endmember extraction for spectral unmixing...