1680 search results - page 21 / 336 » Automated Model Selection for Simulation |
WSC
2001
13 years 9 months ago
2001
This tutorial discusses some statistical procedures for selecting the best of a number of competing systems. The term "best" may refer to that simulated system having, s...
WSC
2008
13 years 10 months ago
2008
We formulate and evaluate distribution-free statistical process control (SPC) charts for monitoring an autocorrelated process when a training data set is used to estimate the marg...
WSC
2004
13 years 9 months ago
2004
A critical aspect of semiconductor manufacturing is the design and analysis of material handling and production control polices to optimize fab performance. As wafer sizes have in...
MDAFA
2004
Springer
14 years 1 months ago
2004
Springer
A key issue in the MDA approach is the transformation of platform independent models to platform specific models. Before transforming to a platform specific model, however, it is n...
WSC
1998
13 years 9 months ago
1998
In simulation modeling and analysis, there are two situations where there is uncertainty about the number of parameters needed to specify a model. The first is in input modeling w...