106 search results - page 7 / 22 » Automated data analysis solutions to silicon debug |
KBSE
2007
IEEE
14 years 29 days ago
2007
IEEE
Monitoring the satisfaction of software requirements and diagnosing what went wrong in case of failure is a hard problem that has received little attention in the Software and Req...
BMCBI
2008
13 years 6 months ago
2008
Background: The availability of sequences from whole genomes to reconstruct the tree of life has the potential to enable the development of phylogenomic hypotheses in ways that ha...
KBSE
2005
IEEE
14 years 8 days ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
KDD
2008
ACM
14 years 7 months ago
2008
ACM
Text classification has matured as a research discipline over the last decade. Independently, business intelligence over structured databases has long been a source of insights fo...
APLAS
2000
ACM
13 years 11 months ago
2000
ACM
We have implemented Kima, an automated error correction system for concurrent logic programs. Kima corrects near-misses such as wrong variable occurrences in the absence of explici...