106 search results - page 8 / 22 » Automated data analysis solutions to silicon debug |
DAC
2007
ACM
14 years 7 months ago
2007
ACM
The trend to multi-core chip designs presents new challenges for design automation, while the increased reuse of components may offer solutions. This paper describes some of the k...
ICLP
2007
Springer
13 years 10 months ago
2007
Springer
We present a static analysis that infers both upper and lower bounds on the usage that a logic program makes of a set of user-definable resources. The inferred bounds will in gener...
DBSEC
2008
13 years 8 months ago
2008
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...
WISES
2004
13 years 8 months ago
2004
-- Debugging software that runs on highly integrated System-on-Chip devices is complicated because conventional debug tools (like traditional In-Circuit Emulators and Logic Analyze...
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...