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CVPR
2007
IEEE
15 years 28 days ago
Multimodal workbench for automatic surveillance applications
Dragos Datcu, Léon J. M. Rothkrantz, Zhenke...
ECCV
2002
Springer
15 years 24 days ago
Automatic Model Selection by Modelling the Distribution of Residuals
Timothy F. Cootes, Neil A. Thacker, Christopher J....
ICIP
2001
IEEE
15 years 15 days ago
Color image segmentation based on automatic morphological clustering
Thierry Géraud, Pierre-Yves Strub, Jé...
ICPR
2002
IEEE
15 years 8 hour ago
Beam Search for Feature Selection in Automatic SVM Defect Classification
Puneet Gupta, David S. Doermann, Daniel DeMenthon