1295 search results - page 68 / 259 » Automatic Design Pattern Detection |
VLSISP
2011
13 years 5 months ago
2011
Machine-learning algorithms are employed in a wide variety of applications to extract useful information from data sets, and many are known to suffer from superlinear increases in ...
EVOW
2008
Springer
14 years 5 days ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
ACL
2009
13 years 8 months ago
2009
This paper presents a novel metric-based framework for the task of automatic taxonomy induction. The framework incrementally clusters terms based on ontology metric, a score indic...
TSE
1998
13 years 10 months ago
1998
—The main goal of this work is to propose a method to evaluate user interfaces using task models and logs generated from a user test of an application. The method can be incorpor...
EURONGI
2008
Springer
14 years 5 days ago
2008
Springer
The objective of this work is to identify some of the traffic characteristics of Wireless Multimedia Sensor Networks (WMSN). Applications such as video surveillance sensor networks...