315 search results - page 26 / 63 » Automatic generation of high coverage usability tests |
DAC
1997
ACM
13 years 12 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
GLVLSI
2002
IEEE
14 years 23 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
IEEEARES
2007
IEEE
14 years 2 months ago
2007
IEEE
Model-based development has become state of the art in software engineering. A number of tools, like Matlab/Simulink or SCADE, are available for the automatic generation of applic...
ICSEA
2007
IEEE
14 years 2 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...