315 search results - page 36 / 63 » Automatic generation of high coverage usability tests |
KBSE
2000
IEEE
13 years 11 months ago
2000
IEEE
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge a...
ATS
2000
IEEE
14 years 7 days ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
DFT
2002
IEEE
14 years 24 days ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
VLSID
1998
IEEE
14 years 2 days ago
1998
IEEE
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
DAGSTUHL
2004
13 years 9 months ago
2004
Although computer systems penetrate all facets of society, the software running those systems may contain many errors. Producing high quality software appears to be difficult and v...