323 search results - page 12 / 65 » Automatic generation of simulation models for semiconductor ... |
DFT
2007
IEEE
14 years 1 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
WSC
2007
13 years 9 months ago
2007
Fluctuations of work-in-progress (WIP) levels cause variability of cycle time and often lead to productivity losses in semiconductor wafer fabrication plants. To identify sources ...
ICRA
2000
IEEE
13 years 12 months ago
2000
IEEE
We present an approach for automatically generating complete process plans, including xturing and CNC code, from high level shape feature part descriptions. The demonstration syst...
CAGD
2008
13 years 7 months ago
2008
In the present paper we give account of an effort that aimed at the unification of the whole geometric preprocessing that preceded the wind tunnel readings with a realistic airpla...
WOSP
2000
ACM
13 years 11 months ago
2000
ACM
For sometime now, Unified Modelling Language (UML) has been accepted as a standard for designing new systems. Its array of notations helps system designers to capture their ideas ...