137 search results - page 13 / 28 » Automatic thresholding for defect detection |
ICIP
2001
IEEE
14 years 10 months ago
2001
IEEE
We describe an algorithm for the analysis of color images of basins which gather dirty water, with the objective of detecting and estimate the presence of exceeding combustible oi...
ICDAR
1999
IEEE
14 years 27 days ago
1999
IEEE
The purpose of this study is to automatically extract telop and flip characters. It starts from the extraction of stable frame sections including the telop and flip characters. Ne...
BMCBI
2005
13 years 8 months ago
2005
Background: Microscopists are familiar with many blemishes that fluorescence images can have due to dust and debris, glass flaws, uneven distribution of fluids or surface coatings...
ICST
2011
IEEE
13 years 9 days ago
2011
IEEE
—Static analysis tools have been widely used to detect potential defects without executing programs. It helps programmers raise the awareness about subtle correctness issues in t...
HOTSWUP
2009
ACM
14 years 1 months ago
2009
ACM
Year after year, the frequency of updated releases of software continues to increase. Without an automated install process, the result is either that a system installs software wi...