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» Bounded-lifetime integrated circuits
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GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
14 years 1 days ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
MSE
2003
IEEE
89views Hardware» more  MSE 2003»
14 years 10 hour ago
An Analog Integrated Circuit Design Laboratory
We present the structure of an analog integrated circuit design laboratory to instruct at both, senior undergraduate and entry graduate levels. The teaching material includes: a l...
Antonio F. Mondragón-Torres, Terry Mayhugh ...
DAC
2012
ACM
11 years 9 months ago
Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...
Xin Zhao, Michael Scheuermann, Sung Kyu Lim
ENGL
2007
63views more  ENGL 2007»
13 years 6 months ago
A Full Integrated Gain Variable LNA for WCDMA
—In this paper we propose a gain-variable low noise amplifier (LNA) for low-voltage and low power WCDMA application. The LNA is designed based on a current-reused topology and a ...
Zhi-Ming Lin, Yu-Chun Huang
TON
2008
95views more  TON 2008»
13 years 6 months ago
Integration of explicit effective-bandwidth-based QoS routing with best-effort routing
This paper presents a methodology for protecting low-priority best-effort (BE) traffic in a network domain that provides both virtual-circuit routing with bandwidth reservation for...
Stephen L. Spitler, Daniel C. Lee