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» Calculating BPEL Test Coverage Through Instrumentation
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ICCAD
2006
IEEE
126views Hardware» more  ICCAD 2006»
14 years 7 months ago
Exploring linear structures of critical path delay faults to reduce test efforts
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
TMI
2010
206views more  TMI 2010»
13 years 5 months ago
Random Subspace Ensembles for fMRI Classification
Classification of brain images obtained through functional magnetic resonance imaging (fMRI) poses a serious challenge to pattern recognition and machine learning due to the extrem...
Ludmila I. Kuncheva, Juan José Rodrí...